סמינר מחלקתי אלקטרוניקה פיזיקאלית : Liron Stern

18 בנובמבר 2018, 13:00 
פקולטה להנדסה, ביניין כיתות, חדר 011 
סמינר מחלקתי אלקטרוניקה פיזיקאלית : Liron Stern

סמינר לירון שטרן

You are invited to attend a lecture

Chip-scale metrology: taming atoms, frequency combs and cavities

:By

Liron Stern

National Institute of Standards and Technology (NIST), Time & Frequency division, 325 Broadway Boulder CO, USA

 

Metrology, the science of measurement, strives to push the limits of human ability to measure quantities such as time, frequency, distance, temperature and mass. This ongoing global effort provides us with a reference “ruler” which is crucial both for understanding the fundamental nature of our universe, as well as an enabling and driving new technologies. Central to such measurements are quantum sensors, such as atomic clocks, magnetometers and superconducting voltage standards which are continuously driving today’s technological revolutions. Nowadays, we are witnessing a universal endeavor to miniaturize such “measuring machines” with two prime motivations: understanding the fundamentals of light-matter interactions at these extreme limits, and enabling new applications in disciplines such as telecommunication, space exploration and medical devices.

 

In this talk, I will present how we move forward to enable chip-scale frequency metrology. First, I will introduce the recently discovered microresonator based Kerr-soliton frequency combs, and experiments and calculations where we have used these as a spectroscopic tool to directly interact with atomic vapour. I will present experimental results where we construct a new type of micro-machined atomic vapour cells where diffractive optics are merged with atomic physics. I will describe how these devices map atomic states to the spatial distribution of diffracted light, and how we can utilize these effects to allow offset frequency locks with high stability. Finally, I will present a miniaturized cavity with a quality factor of a billion, interfaced with an atomic micromachined atomic cell, providing ~100 Hz of linewidth and stable optical frequency. To conclude, I will show how interfacing atoms, Kerr-combs, and miniaturized cavities paves the way to a fully chip-scale metrology system, and discuss the huge impact such system may cast on science and technology.

 

On Sunday, November 18, 2018, 13:00

Room 011, Kitot building

 

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