Departmental Seminar - Materials Science and Engineering: Prof. Dirk Raabe

Atomic-scale Analysis of Materials using Advanced Atom Probe Tomography

Dr. Dierk Raabe

Professor, Director

Max-Planck-Institut für Eisenforschung

Germany

Abstract:

Recent progress in developing and using correlative methods for the joint analysis of complex materials using by Atom Probe Tomography (LEAP 3000, LEAP 5000) in conjunction with Electron Microscopy (SEM, TEM, STEM, Cs corrected Titan Themis) and Field Ion Microscopy is presented. Measurements are conducted on the same atom probe sample tips and in some cases atomic resolution is reached. Methods related to crystallographic atom probe tomography are also presented and discussed.

Examples from functional and structural materials are presented including segregation effects in multicrystalline silicon solar cells and their relation to cell efficiency, superalloys for advanced turbines, high strength steels and hydrides.