סמינר מחלקתי - אלקטרוניקה פיזיקאלת עמיחי מאירי

You are invited to attend a lecture

Enhancing optical nanoscopy by point-spread-function
spatial modulation

By:

Amihai Meiri

Faculty of Engineering, Bar Ilan University.

Abstract

An optical microscope has a fundamental limit of resolution: the diffraction limit, approximately 200nm for visible light. Nanoscopy methods such as STED and PALM/STORM were developed to overcome this limitation, and are capable of optical imaging with a resolution of 20– 50nm. Localization microscopy methods (PALM/STORM and single particle tracking) rely on the ability to precisely find the position of a single point emitter, where the resolution depends directly on the precision of localization.
In this talk I will describe how spatial modulation of the signal coming from a microscope can improve the capability to localize single emitters, in particular for particle tracking applications using scattering objects such as metal nanoparticles.  In addition, I will show how this technique may be applicable to incoherent point sources such as fluorescent probes. This solution allows for faster, higher resolution imaging with relatively simple and low cost means, and can be used with any optical microscope.

On Thursday, March 30, 2017, 15:00
Room 011, Kitot building