Simon Anuk - Optimal Detection of non-overlapping images via combinatorial auction
סמינר מחלקת מערכות - EE Systems Seminar
Electrical Engineering Systems Zoom Seminar
Join Zoom Meeting
https://tau-ac-il.zoom.us/j/87366402042
Speaker: Simon Anuk
M.Sc. student under the joint supervision of Dr. Tamir Bendory and Dr. Amichai Painsky
Wednesday, 7th February 2024, at 14:00
Optimal Detection of non-overlapping images via combinatorial auction
Abstract
We study the classical problem of detecting the location of multiple image occurrences in a two-dimensional, noisy measurement. Assuming the image occurrences do not overlap, we formulate this task as a constrained maximum likelihood optimization problem. We show that the maximum likelihood estimator is equivalent to an instance of the winner determination problem from the field of combinatorial auction, and that the solution can be obtained by searching over a binary tree. We then design a pruning mechanism that significantly accelerates the runtime of the search. We demonstrate on simulations and electron microscopy data sets that the proposed algorithm provides accurate detection in challenging regimes of high noise levels and densely packed image occurrences.
השתתפות בסמינר תיתן קרדיט שמיעה = עפ"י רישום בצ'אט של שם מלא + מספר ת.ז.

