EE Seminar: Faster Guaranteed GAN-based recovery in Linear Inverse Problems
(The talk will be given in English)
Speaker: Prof. Yoram Bresler
Coordinated Science Laboratory and the Department of ECE,
University of Illinois at Urbana-Champaign
Monday, February 10th, 2020
15:00 - 16:00
Room 011, Kitot Bldg., Faculty of Engineering
Faster Guaranteed GAN-based recovery in Linear Inverse Problems
Abstract
A Generative Adversarial Network (GAN) trained to model the prior of images has been shown to perform better than sparsity-based regularizers in ill-posed inverse problems. We describe an approach along these lines, with some modifications and refinements, with the following features: (1) on a given class of images, it addresses different linear inverse problems without re-training the neural network; (2) it accelerates the computation substantially as compared to previous GAN-based methods; and (3) it comes with a recovery guarantee. Experiments on several inverse problems demonstrate substantial speedup over earlier GAN-based recovery methods, along with better accuracy.
Short Bio
Yoram Bresler received the B.Sc. and M.Sc. from the Technion–Israel Institute of Technology, and the Ph.D. from Stanford University all in electrical engineering. He is currently a Founder Professor of Engineering with the Departments of Electrical and Computer Engineering and Bioengineering, and the Coordinated Science Laboratory at the University of Illinois at Urbana–Champaign. He is also the founding President and the Chief Technology Officer at InstaRecon, Inc., commercializing breakthrough technology for tomographic reconstruction developed in his academic research. His research interests include machine learning and statistical signal processing and their applications to inverse problems in imaging, including compressed sensing, computed tomography, and magnetic resonance imaging.
Dr. Bresler was a Faculty Fellow at the National Center for Super Computing Applications in 2006. He is a recipient of the 1991 NSF Presidential Young Investigator Award, the Technion Fellowship in 1995, and the Xerox Senior Award for Faculty Research in 1998. He was named as the University of Illinois Scholar in 1999, and was appointed as an Associate at the Center for Advanced Study of the University in 2001. He has served on the editorial board of several journals, including the IEEE TSP, the IEEE JSTSP, Machine Vision and Applications, the SIAM Journal on Imaging Science, and on various committees of the IEEE.
Dr. Bresler is a fellow of the IEEE and the AIMBE. His papers have received 4 best journal paper awards, two of these with his students. In 2016, he was appointed IEEE SPS Distinguished Lecturer.
